IFTS, Inc. USA’s President Gerard J. Lynch, P.E. was a speaker at the American Filtration & Separations Society’s (AFS) Mid-Atlantic Chapter Meeting on September 18th. Lynch presented “The Development and Validation of Low Micron Efficiency Testing Standards” at the conference held at Graver Technologies located in Newark, Delaware.
To address the increasing demand from the filtration industry and new applications in sub micron / low micron filtration, IFTS had implemented an internal project to develop a test bench for filters and filter media with a filtration threshold from 200 nm to 1500 nm.
More and more industry partners have shown interest in validation methods for this level of filtration, including the design of the ultrafiltration membranes, antibacterial filters, nuclear power, and semiconductors.
The new sub micron test method has now been calibrated and validated and several clients have moved forward with using these tests.
The annual AFS Mid-Atlantic Chapter includes members from Delaware, Maryland, New Jersey, southern New York and Pennsylvania. Lynch has been the President of this chapter since 1999.